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dc.contributor.authorRaviprakash, Y.-
dc.contributor.authorBangera, K.V.-
dc.contributor.authorShivakumar, G.K.-
dc.date.accessioned2020-03-31T08:31:24Z-
dc.date.available2020-03-31T08:31:24Z-
dc.date.issued2010-
dc.identifier.citationCurrent Applied Physics, 2010, Vol.10, 1, pp.193-198en_US
dc.identifier.urihttp://idr.nitk.ac.in/jspui/handle/123456789/11447-
dc.description.abstractCdxZn(1-x)S (x = 0, 0.2, 0.4, 0.6, 0.8, and 1) thin films were deposited by the chemical spray pyrolysis technique using a less used combination of chemicals. Depositions were done at 573 K on cleaned glass substrates. The composition, surface morphology and structural properties of deposited films were studied using EDAX, SEM and X-ray diffraction technique. XRD studies reveal that all the films are crystalline with hexagonal (wurtzite) structure and inclusion of Cd into the structure of ZnS improved the crystallinity of the films. The value of lattice constant 'a' and 'c' have been observed to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm, respectively. The band gap of the thin films varied from 3.32 to 2.41 eV as composition varied from x = 0.0-1.0. It was observed that presence of small amount of cadmium results in marked changes in the optical band gap of ZnS. 2009 Elsevier B.V. All rights reserved.en_US
dc.titleGrowth, structural and optical properties of CdxZn1-xS thin films deposited using spray pyrolysis techniqueen_US
dc.typeArticleen_US
Appears in Collections:1. Journal Articles

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