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DC Field | Value | Language |
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dc.contributor.author | Bhowmik B. | |
dc.contributor.author | Biswas S. | |
dc.contributor.author | Deka J.K. | |
dc.contributor.author | Bhattacharya B.B. | |
dc.date.accessioned | 2021-05-05T10:15:59Z | - |
dc.date.available | 2021-05-05T10:15:59Z | - |
dc.date.issued | 2020 | |
dc.identifier.citation | Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI , Vol. 2020-July , , p. 200 - 205 | en_US |
dc.identifier.uri | https://doi.org/10.1109/ISVLSI49217.2020.00044 | |
dc.identifier.uri | http://idr.nitk.ac.in/jspui/handle/123456789/14916 | - |
dc.description.abstract | Networks-on-chip (NoCs) provide the essential communication infrastructure for building today's on-chip multiprocessors. Albeit mesh is commonly used as the underlying interconnection architecture, other regular topologies such as octagons or spidergons, find recent applications to hybrid, small-world, and smart networks. Aggressive technology scaling, however, makes NoCs susceptible to manufacturing defects and causes failures in their operations. This paper presents a distributed, on-line built-in-self-test (BIST) mechanism that targets open faults on communication channels in an octagon NoC. We introduce a novel test scheduling scheme that exploits the knowledge of multithreading for reducing the overall test time with minimal degradation of performance. We evaluate the proposed test scheme for a 16-bit octagon NoC and report experimental results. © 2020 IEEE. | en_US |
dc.title | Locating open-channels in octagon networks on chip-microprocessors | en_US |
dc.type | Conference Paper | en_US |
Appears in Collections: | 2. Conference Papers |
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